Discrete film thickness in polyacrylamide-CdS nanocomposite ultrathin films

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 70, Issue 5 1, 2004, Pages

  Singh, Amarjeet ^a   Mukherjee, M ^a  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN BONDS; LIGHT SCATTERING; NANOSTRUCTURED MATERIALS; PLASTIC FILMS; SOLS; SPIN COATING; SURFACE ROUGHNESS; SYNTHESIS (CHEMICAL); THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

INTERCHAIN ENTANGLEMENT; NANOCOMPOSITE SOLS; POWER LAW; X-RAY REFLECTIVITY;

ULTRATHIN FILMS;

EID: 41349122189     PISSN: 15393755     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.70.051608     Document Type: Article

References (28)

1. E. K. Lin, R. Kolb, S. K. Satija, and W. L. Wu, Macromolecules 32, 3753 (1999).
2. J. Kraus, P. Muller-Buschbaum, T. Kuhlmann, D. W. Schubert, and M. Stamm, Europhys. Lett. 49, 210 (2000).
3. M. Mukherjee, M. Bhattacharya, M. K. Sanyal, Th. Geue, J. Grenzer, and U. Pietsch, Phys. Rev. E 66, 061801 (2002).
4. A. Singh and M. Mukherjee, Macromolecules 36, 8728 (2003), and references therein.
5. Y. Tang, T. J. Su, J. Armstrong, J. R. Lu, A. L. Lewis, T. A. Vick, P. W. Startford, R. K. Heenan, and J. Penfold, Macromolecules 36, 8440 (2003).
6. J. U. Kim and Ben O'Shaughnessy Phys. Rev. Lett. 89, 238301 (2002).
7. M. Mukherjee, A. Dutta, and D. Chakravorty, Appl. Phys. Lett. 64, 1159 (1994).
8. D. H. Cole, K. R. Shull, L. E. Rehn, and P. Baldo, Phys. Rev. Lett. 78, 5006 (1997).
9. M. Mukherjee, D. Chakravorty, and P. M. G. Nambissan, Phys. Rev. B 57, 848 (1998).
10. P. Mustarelli, C. Capiglia, E. Quartarone, C. Tomasi, P. Ferloni, and L. Linati, Phys. Rev. B 60, 7228 (1999).
11. M. Mukherjee, N. Deshmukh, and S. K. Kulkarni, Appl. Surf. Sci. 218, 323 (2003).
12. S. W. Yeh, and K. H. Wei, Macromolecules 36, 7907 (2003).
13. Z. P. Qiao, Y. Xie, G. Li, Y. J. Zhu, and Y. T. Qian, J. Mater. Sci. 35, 285 (2000).
14. M. Chen, Y. Xie, Z. P. Qiao, Y. J. Zhu, and Y. T. Qian, J. Mater. Chem. 10, 329 (2000).
15. A. G. Emslie, F. T. Bonner, and L. G. Peck, J. Appl. Phys. 29, 858 (1958).
16. A. Acrivos, M. J. Shah, and E. E. Petersen, J. Appl. Phys. 31, 963 (1960).
17. D. Meyerhofer, J. Appl. Phys. 49, 3993 (1978).
18. W. W. Flack, D. S. Soong, A. T. Bell, and D. W. Hess, J. Appl. Phys. 56, 1199 (1984).
19. M. Yanagisawa, J. Appl. Phys. 61, 1034 (1987).
20. C. J. Lawrence, Phys. Fluids 31, 2786 (1988).
21. R. K. Yonkoski and D. S. Soana, J. Appl. Phys. 72, 725 (1992).
22. S. K. Wilson, R. Hunt, and B. R. Duffy, J. Fluid Mech. 413, 65 (2000).
23. Y. Wang and N. Herron, Phys. Rev. B 42, 7253 (1990).
24. Soft Matter Physics, edited by M. Daoud and C. E. Williams (Springer, Berlin, 1999).
25. L. G. Parratt, Phys. Rev. 95, 359 (1954).
26. T. P. Russel, Materials Science Reports (Elsevier North-Holland, Amsterdam, 1990), Vol. 5.
27. Jean Dailland and Alain Gibaud, X-Ray and Neutron Reflectivity: Principles and Applications, (Springer, Berlin, 1999).
28. W. J. Daughton and F. L. Givens, J. Electrochem. Soc. 129, 173 (1982).