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Volumn 65, Issue 4, 2002, Pages
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Self-organized criticality: Robustness of scaling exponents
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Author keywords
[No Author keywords available]
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Indexed keywords
ASPECT RATIO;
COMPUTER SIMULATION;
GRANULAR MATERIALS;
MAGNETIC MATERIALS;
MATHEMATICAL MODELS;
ROBUSTNESS (CONTROL SYSTEMS);
SELF ORGANIZING STORAGE;
AVALANCHE AREA DISTRIBUTION;
AVALANCHE DYNAMICS;
GRAIN DENSITY;
SANDPILE MODEL;
CRITICAL PATH ANALYSIS;
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EID: 41349119558
PISSN: 15393755
EISSN: 15502376
Source Type: Journal
DOI: 10.1103/PhysRevE.65.046141 Document Type: Article |
Times cited : (5)
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References (36)
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