Argus: Low-cost, comprehensive error detection in simple cores

IEEE Micro

Volumn 28, Issue 1, 2008, Pages 52-59

  Meixner, Albert ^a   Bauer, Michael E ^a   Sorin, Daniel J ^a,b  

^a DUKE UNIVERSITY   (United States)

^b NONE   (United States)

Author keywords

Dependability; Error detection; Fault tolerance; Microarchitecture

Indexed keywords

COMPUTATION THEORY; ERROR DETECTION; MICROPROCESSOR CHIPS; MICROPROGRAMMING; STORAGE ALLOCATION (COMPUTER);

CONTROL FLOW; DATA FLOW; DEPENDABILITY; MEMORY ACCESS; MICROARCHITECTURE; VON NEUMANN CORE;

FAULT TOLERANCE;

EID: 41349107838     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/MM.2008.3     Document Type: Article

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