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Volumn 70, Issue 5 2, 2004, Pages

Electron trapping by electric field reversal and Fermi mechanism

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; ELECTRIC DISCHARGES; ELECTRON SCATTERING; ELECTRON TRAPS; PLASMAS; SPECTROSCOPY;

EID: 41349089499     PISSN: 15393755     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.70.056409     Document Type: Article
Times cited : (5)

References (29)
  • 10
    • 11844261752 scopus 로고    scopus 로고
    • A. Bogaerts and R. Gijbels, J. Anal. At. Spectrom. 13, 721726 (1998); A. Bogaerts, A. Okhrimovskyy, and R. Gijbels, ibid. 17, 10761082 (2002).
    • (1998) J. Anal. At. Spectrom. , vol.13 , pp. 721726
    • Bogaerts, A.1    Gijbels, R.2
  • 12
    • 11844302511 scopus 로고    scopus 로고
    • V. Kolobov and R. Arslanbekov, Microelectron. Eng. 69, 606615 (2003); A. Fedoseyev, V. Kolobov, R. Arslanbekov, and A. Przekwas, ibid 69, 577 (2003).
    • (2003) Microelectron. Eng. , vol.69 , pp. 606615
    • Kolobov, V.1    Arslanbekov, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.