메뉴 건너뛰기




Volumn 71, Issue 4, 2005, Pages

Random-walk statistics in moment-based O(N) tight binding and applications in carbon nanotubes

Author keywords

[No Author keywords available]

Indexed keywords

ATOMISTIC MODELING; ELECTRONIC DENSITY; RANDOM WALK; TIGHT-BINDING ATOMISTIC METHOD;

EID: 41349089273     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.71.046701     Document Type: Article
Times cited : (8)

References (18)
  • 9
    • 0000177345 scopus 로고    scopus 로고
    • R. N. Silver and H. Roder, Phys. Rev. E 56, 4822 (1997); A. F. Voter, J. D. Kress, and R. N. Silver, Phys. Rev. B 53, 12 733 (1996).
    • (1997) Phys. Rev. E , vol.56 , pp. 4822
    • Silver, R.N.1    Roder, H.2
  • 15
    • 2942655369 scopus 로고    scopus 로고
    • J. Q. Lu, J. Wu, W. Duan, and B. L. Gu, Appl. Phys. Lett. 84, 4203 (2004); J. Q. Lu, J. Wu, W. Duan, F. Liu, B. F. Zhu, and B. L. Gu, Phys. Rev. Lett. 90, 156601 (2003).
    • (2004) Appl. Phys. Lett. , vol.84 , pp. 4203
    • Lu, J.Q.1    Wu, J.2    Duan, W.3    Gu, B.L.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.