Microwave dielectric properties and sintering behavior of nano-scaled (α + θ)-Al2O3 ceramics

Materials Research Bulletin

Volumn 43, Issue 6, 2008, Pages 1463-1471

  Huang, Cheng Liang ^a   Wang, Jun Jie ^a   Yen, Fu Su ^a   Huang, Chi Yuen ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

A. Ceramics; A. Oxides; B. Crystal growth; B. Dielectric properties

Indexed keywords

ALUMINA; CRYSTAL GROWTH; DIELECTRIC PROPERTIES; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; MICROWAVE FREQUENCIES; SINTERING; X RAY DIFFRACTION;

QUALITY FACTORS; TEMPERATURE COEFFICIENTS;

CERAMIC MATERIALS;

EID: 41349085784     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2007.06.032     Document Type: Article

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