Ensemble LUT classification for degraded document enhancement

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6815, Issue , 2008, Pages

  Obafemi Ajayi, Tayo ^a   Agam, Gady ^a   Frieder, Ophir ^a  

^a Illinois Institute of Technology   (United States)

Author keywords

Document degradation models; Document image analysis; Ensemble classification; Historical documents; Image enhancement

Indexed keywords

DOCUMENT DEGRADATION MODELS; DOCUMENT IMAGE ANALYSIS; ENSEMBLE CLASSIFICATION; HISTORICAL DOCUMENTS;

ALGORITHMS; IMAGE ANALYSIS; INFORMATION RETRIEVAL SYSTEMS; MATHEMATICAL MODELS;

IMAGE ENHANCEMENT;

EID: 41149175453     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.767120     Document Type: Conference Paper

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