Balancing SoC design and technology challenges at 45nm

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2006, Pages 1-2

  Stork, J M C ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COST EFFECTIVENESS; DIES; LOGIC CIRCUITS; MOBILE TELECOMMUNICATION SYSTEMS;

ANALOG FUNCTIONS; GATE DENSITY;

CMOS INTEGRATED CIRCUITS;

EID: 41149168757     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/vlsit.2006.1705188     Document Type: Conference Paper

References (0)