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Volumn , Issue , 2006, Pages 38-39

Optical frequency domain reflectometry for single- and multi-mode avionics fiber-optics applications

Author keywords

[No Author keywords available]

Indexed keywords


EID: 41149168294     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/avfop.2006.1707489     Document Type: Conference Paper
Times cited : (21)

References (1)
  • 1
    • 13544275829 scopus 로고    scopus 로고
    • High resolution optical frequency domain reflectometry for characterization of components and assemblies
    • B. J. Soller, D. K. Gifford, M. S. Wolfe, and M. E. Froggatt, "High resolution optical frequency domain reflectometry for characterization of components and assemblies," Opt. Express 13, 666-674 (2005)
    • (2005) Opt. Express , vol.13 , pp. 666-674
    • Soller, B.J.1    Gifford, D.K.2    Wolfe, M.S.3    Froggatt, M.E.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.