Image mapping using local and global statistics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6806, Issue , 2008, Pages

  Yuanzhen, Li ^a   Adelson, Edward ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Denoising; Image mapping; Superresolution

Indexed keywords

GLOBAL STATISTICS; IMAGE DENOISING; IMAGE MAPPING; SUPERRESOLUTION;

FEATURE EXTRACTION; IMAGE RESOLUTION; LINEAR REGRESSION; PROBLEM SOLVING; SIGNAL TO NOISE RATIO; STATISTICS;

IMAGE ACQUISITION;

EID: 41149142889     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.784164     Document Type: Conference Paper

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