On the partial differential equations of electrostatic MEMS devices III: Refined touchdown behavior

Journal of Differential Equations

Volumn 244, Issue 9, 2008, Pages 2277-2309

  Guo, Yujin ^a,b  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^b UNIVERSITY OF MINNESOTA   (United States)

Author keywords

MEMS; Pull in voltage; Quenching profiles; Self similar

Indexed keywords

EID: 41149100424     PISSN: 00220396     EISSN: 10902732     Source Type: Journal    
DOI: 10.1016/j.jde.2008.02.005     Document Type: Article

References (18)

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