Growth of p- and n-dopable films from electrochemically generated C 60 cations

Journal of the American Chemical Society

Volumn 130, Issue 12, 2008, Pages 3788-3796

  Bruno, Carlo ^a   Marcaccio, Massimo ^a   Paolucci, Demis ^a   Castellarin Cudia, Caria ^b   Goldoni, Andrea ^b   Streletskii, Alexey V ^c   Drewello, Thomas ^c   Barison, Simona ^d   Venturini, Alessandro ^d   Zerbetto, Francesco ^a   Paolucci, Francesco ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b SINCROTRONE TRIESTE   (Italy)

^c UNIVERSITY OF WARWICK   (United Kingdom)

^d CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL ANODIC PROCESS; ELECTRON-ACCEPTOR PROPERTIES; MATRIX-ASSISTED LASER DESORPTIONZIONIZATION (MALDI);

ATOMIC FORCE MICROSCOPY; ELECTROCHEMICAL OXIDATION; MECHANICAL STABILITY; SCANNING ELECTRON MICROSCOPY; THERMODYNAMIC STABILITY;

FILM GROWTH;

C60 CATION; CATION; UNCLASSIFIED DRUG;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTROCHEMICAL ANALYSIS; ELECTRON; FILM; INFRARED SPECTROSCOPY; MASS SPECTROMETRY; MATRIX ASSISTED LASER DESORPTION IONIZATION TIME OF FLIGHT MASS SPECTROMETRY; OXIDATION; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; THERMOSTABILITY; X RAY PHOTOELECTRON SPECTROSCOPY;

CATIONS; ELECTROCHEMISTRY; ELECTRODES; FULLERENES; MEMBRANES, ARTIFICIAL; MICROSCOPY, ELECTRON, SCANNING; OXIDATION-REDUCTION; PARTICLE SIZE; PLATINUM; SPECTROMETRY, MASS, SECONDARY ION; SPECTRUM ANALYSIS; SURFACE PROPERTIES; X-RAYS;

EID: 41149094463     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja0733179     Document Type: Article

References (71)

1. Haymet, A. D. J. Chem. Phys. Lett. 1985, 122, 421.
2. Disch, R. L.; Schulman, J. M. Chem. Phys. Lett. 1986, 125, 465.
3. Bausch, J. W.; Prakash, G. K. S.; Olah, G. A.; Tse, D. S.; Lorents, D. C.; Bae, Y. K.; Malhotra, R. J. Am. Chem. Soc. 1991, 113, 3205.
4. Fox, M. A.; Colapret, K. A.; Hurst, J. R.; Soulen, R. L.; Maldonado, R.; Echegoyen, L. J. Org. Chem. 1992, 57, 3728.
5. Strasser, P.; Ata, M. J. Phys. Chem. B 1998, 102, 4131.
6. (a) Fedurco, M.; Costa, D. A.; Balch, A. L.; Fawcett, W. R. Angew. Chem., Int. Ed. Engl. 1995, 34, 194.
7. (b) Winkler, K.; Costa, D. A.; Balch, A. L.; Fawcett, W. R. J. Phys. Chem. 1995, 99, 17431.
8. (a) Winkler, K.; Costa, D. A.; Fawcett, W. R.; Balch, A. L. Adv. Mater. 1997, 9, 153.
9. (b) Krinichnaya, E. P.; Moravsky, A. P.; Efimov, O.; Sobczak, J. W.; Winkler, K.; Kutner, W.; Balch, A. L. J. Mater. Chem. 2005, 15, 1468.
10. Janda, P.; Krieg, T.; Dunsch, L. Adv. Mater. 1998, 10, 1434.
11. Deutsch, D.; Tarábek, J.; Krause, M.; Janda, P.; Dunsch, L. Carbon 2004, 42, 1137.
12. (a) Nagashima, H.; Nakaoka, A.; Saito, Y.; Kato, M.; Kawanishi, T.; Itoh, K. J. Chem. Soc., Chem. Commun. 1992, 377.
13. (b) Balch, A. L.; Costa, D. A.; Winkler, K. J. Am. Chem. Soc. 1998, 120, 9614.
14. (c) Winkler, K.; de Bettencourt-Dias, A.; Balch, A. L. Chem. Mater. 1999, 11, 2265.
15. (d) Winkler, K.; de Bettencourt-Dias, A.; Balch, A. L. Chem. Mater. 2000, 12, 1386.
16. (e) Winkler, K.; Balch, A. L. C. R. Chim. 2006, 9, 928.
17. (f) Plonska, M. A.; de Bettencourt-Dias, A.; Balch, A. L.; Winker, K. Chem. Mater. 2003, 15, 4122.
18. (g) Hayashi, A.; Yamamoto, S.; Suzuki, K.; Matsuoka, T. J. Mater. Chem. 2004, 14, 2633.
19. (h) Grodzka, E.; Nieciecka, M.; Winkler, K. J. Solid State Electrochem. 2007, DOI 10.1007/s10008-007-0358-5.
20. Rao, A. M.; Eklund, P. C.; Hodeau, J. L.; Marques, L.; Nunez-Regueiro, M. Phys. Rev. B 1997, 55, 4766.
21. (a) Rao, A. M.; Zhou, P.; Wang, K.-A.; Hager, G. T.; Holden, J. M.; Wang, Y.; Lee, W.-T.; Bi, X.-X.; Eklund, P. C.; Cornett, D. S.; Duncan, M. A.; Amster, I. J. Science 1993, 259, 955-960.
22. (b) Zhou, P.; Dong, Z.-H.; Rao, A. M.; Eklund, P. C. Chem. Phys. Lett. 1993, 211, 337.
23. (c) Wang, Y.; Holden, J. M.; Dong, Z.-H.; Bi, X.-X.; Eklund, P. C. Chem. Phys. Lett. 1993, 211, 341.
24. (d) Strout, D. L.; Murry, R. L.; Xu, C.; Eckhoff, W. C.; Odom, G. K.; Scuseria, G. E. Chem. Phys. Lett. 1993, 214, 576.
25. (e) Pekker, S.; Janossy, A.; Mihaly, L.; Chauvet, O.; Carrard, M.; Forro, L. Science 1994, 265, 1077.
26. (f) Sun, Y.-P.; Ma, B.; Bunker, C. E.; Liu, B. J. Am. Chem. Soc. 1995, 117, 12705.
27. (g) Cataldo, F. Polym. Int. 1999, 48, 143.
28. (a) Takahashi, N.; Dock, H.; Matsuzawa, N.; Ata, M. J. Appl. Phys. 1993, 74, 5790.
29. (b) Zou, Y. J.; Zhang, X. W.; Li, Y. L.; Wang, B.; Yan, H.; Cui, J. Z.; Liu, L. M.; Da, D. A. J. Mater. Sci. 2002, 37, 1043.
30. (a) Iwasa, Y. et al. Science 1994, 264, 1570.
31. (b) Kuzmany, H.; Winter, J.; Burger, B. Synth. Met. 1997, 85, 1173.
32. Sundqvist, B. Physica B 1999, 265, 208.
33. Moret, R.; Wågberg, T.; Sundqvist, B. Carbon 2005, 43, 709.
34. Sundqvist, B.; Edlund, U.; Jacobsson, P.; Johnels, D.; Jun, J.; Launois, P.; Moret, R.; Persson, P.-A.; Soldatov, A.; Wågberg, T. Carbon 1998, 36, 657.
35. (b) Bashkin, I. O.; Izotov, A. N.; Moravsky, A. P.; Negrii, V. D.; Nikolaev, R. K.; Ossipyan, Yu. A.; Ponyatovsky, E. G.; Steinman, E. A. Chem. Phys. Lett. 1997, 272, 32.
36. (c) Andriotis, A. N.; Menon, M.; Sheetz, R. M.; Chernozatonskii, L. Phys. Rev. Lett. 2003, 90, 026801-1.
37. (a) Giacalone, F.; Martín, N. Chem. Rev. 2006, 106, 5136.
38. (b) Winkler, K.; Balch, A. L.; Kutner, W. J. Solid State Electrochem. 2006, 10, 761.
39. (a) Xie, Q.; Arias, F.; Echegoyen, L. J. Am. Chem. Soc. 1993, 115, 9818-9819.
40. (b) Reed, C. A.; Kim, K.-C.; Bolskar, R. D.; Mueller, L. J. Science 2000, 289, 101.
41. (c) Bruno, C.; Doubitski, I.; Marcaccio, M.; Paolucci, F.; Paolucci, D.; Zaopo, A. J. Am. Chem. Soc. 2003, 125, 15738.
42. (a) Paolucci, F.; Marcaccio, M.; Roffia, S.; Orlandi, G.; Zerbetto, F.; Prato, M.; Maggini, M.; Scorrano, G. J. Am. Chem. Soc. 1995, 117, 6572.
43. (b) Paolucci, F.; Carano, M.; Ceroni, P.; Monier, L.; Roffia, S. J. Electrochem. Soc. 1999, 146, 3357.
44. (c) Carano, M.; Da Ros, T.; Fanti, M.; Kordatos, K.; Marcaccio, M.; Paolucci, M.; Prato, M.; Roffia, S.; Zerbetto, F. J. Am. Chem. Soc. 2003, 125, 7139.
45. Chlistunoff, J. B.; Bard, A. J. Inorg. Chem. 1992, 31, 4582.
46. Amatore, C. A.; Jutand, A.; Pfluger, F. J. Electroanal. Chem. 1987, 218, 361.
47. Tolstogouzov, A.; Daolio, S.; Pagura, C.; Greenwood, C. L. Int. J. Mass Spectrom. 2002, 214, 327.
48. Troullier, N.; Martins, J. L. Phys. Rev. B 1992, 46, 1754.
49. (a) Heinze, J. In Encyclopedia of Electrochemistry; Bard, A. J., Stratmann, M., Schäfer, H. J., Eds.; Wiley-VCH: Weinheim, 2004; Vol. 8, p 605.
50. (b) Deronzier, A.; Moutet, J.-C. Coord. Chem. Rev. 1996, 147, 339.
51. (a) Reed, C. A.; Bolskar, R. D. Chem. Rev. 2000, 100, 1075.
52. (b) Kim, K.-C.; Hauke, F.; Hirsch, A.; Boyd, P. D. W.; Carter, E.; Armstrong, R. S.; Lay, P. A.; Reed, C. A. J. Am. Chem. Soc. 2003, 125, 4024.
53. Wang, Y.; Holden, J. M.; Rao, A. M.; Eklund, P. C.; Venkateswaran, U. D.; Eastwood, D.; Lidberg, R. L.; Dresselhaus, G.; Dresselhaus, M. S. Phys. Rev. B 1995, 51, 4547.
54. Frisch, M. J. et al. Gaussian 03, Revision C.02; Gaussian, Inc.: Wallingford, CT, 2004.
55. Becke, A. D. J. Chem. Phys. 1993, 98, 5648.
56. (a) Wågberg, T.; Jacobsson, P.; Sundqvist, B. Phys. Rev. B 1999, 60, 4535.
57. (b) Winter, J.; Kuzmany, H.; Soldatov, A.; Persson, P.-A.; Jacobsson, P.; Sundqvist, B. Phys. Rev. B 1996, 54, 17486.
58. (c) Wågberg, T.; Persson, P.-A.; Sundqvist, B.; Jacobsson, P. Appl. Phys. A 1997, 64, 223.
59. (d) Chambers, G.; Henderson, K.; Dalton, A. B.; Mc Carty, B.; Byrne, H. J. Synth. Met. 2001, 121, 1111.
60. (a) Yamawaki, H.; Yoshida, Y.; Kakudate, Y.; Usuba, S.; Yokoi, H.; Fujiwara, S.; Aoki, K.; Ruoff, R.; Malhotra, R.; Lorents, D. J. Phys. Chem. 1993, 97, 11161.
61. (b) Stepanian, S. G.; Karachevtsev, V. A.; Plokhotnichenko, A. M.; Adamowitz, L.; Rao, A. M. J. Phys. Chem. B 2006, 110, 15769.
62. Goldoni, A.; Cepek, C.; Larciprete, R.; Sangaletti, L.; Pagliara, S.; Paolucci, G.; Sancrotti, M. Phys. Rev. Lett. 2002, 88, 196102.
63. Li, H.-N.; Wang, X.-X.; Ding, W.-F. Surf. Sci. 2006, 153, 96.
64. Goldoni, A.; Larciprete, R.; Gregoratti, L.; Kaulich, B.; Kiskinova, M.; Zhang, Y.; Dai, H.; Sangaletti, L.; Parmigiani, F. Appl. Phys. Lett. 2002, 80, 2165.
65. Doniach, S.; Sunijc, M. J. Phys. C 1970, 3, 285.
66. Winkler, K.; Noworyta, K.; de Bettencourt-Dias, A.; Sobczak, J. W.; Wu, C.-T.; Chen, L.-C.; Kutner, W.; Balch, A. L. J. Mater. Chem. 2003, 13, 518.
67. Mitsumoto, R. et al. J. Phys. Chem. A 1998, 102, 552-560. NIST XPS database, http://srdata.nist.gov/xps/.
68. (a) Cornett, D. S.; Amster, I. J.; Duncan, M. A.; Rao, A. M.; Eklund, P. C. J. Phys. Chem. 1993, 97, 5036.
69. (b) Ata, M.; Kurihara, K.; Takahashi, N. J. Phys. Chem. B 1997, 101, 5.
70. Wang, G.-W.; Komatsu, K.; Murata, Y.; Shiro, M. Nature 1997, 387, 583.
71. Sun, D.; Reed, C. A. Chem. Commun. 2000, 2391.