Surface characterization by X-ray photoelectron spectroscopy and cyclic voltammetry of products formed during the potentiostatic reduction of chalcopyrite

Electrochimica Acta

Volumn 53, Issue 14, 2008, Pages 4889-4899

  Nava, Dora ^a   González, Ignacio ^a   Leinen, Dietmar ^b   Ramos Barrado, José R ^b  

^a DEPARTAMENTO DE QUÍMICA   (Mexico)

^b UNIVERSITY OF MÁLAGA   (Spain)

Author keywords

Bornite; Chalcocite; Chalcopyrite; Cyclic voltammetry; Potentiostatic reduction; XPS

Indexed keywords

CYCLIC VOLTAMMETRY; PYRITES; REDUCTION; X RAY PHOTOELECTRON SPECTROSCOPY;

BORNITE; CHALCOCITE; CHALCOPYRITE; POTENTIOSTATIC REDUCTION;

SURFACE ANALYSIS;

EID: 41049094927     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2008.01.088     Document Type: Article

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