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Volumn 37, Issue 2, 2008, Pages 133-136
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Localisation of trace metals in metal-accumulating plants using μ-PIXE
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Author keywords
[No Author keywords available]
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Indexed keywords
ION BEAMS;
PLANTS (BOTANY);
ELEMENTAL DISTRIBUTION;
HIGH SENSITIVITY;
HIGH SPATIAL RESOLUTION;
HIGH-RESOLUTION MAPPING;
LOCALISATION;
MICRO BEAMS;
PARTICLE INDUCED X-RAY EMISSION;
PLANT LEAVES;
SENSITIVE TECHNIQUES;
TRACE METAL;
TRACE ELEMENTS;
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EID: 41049086001
PISSN: 00498246
EISSN: 10974539
Source Type: Journal
DOI: 10.1002/xrs.1035 Document Type: Conference Paper |
Times cited : (17)
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References (9)
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