Nanogaps with very large aspect ratios for electrical measurements

Applied Physics Letters

Volumn 92, Issue 11, 2008, Pages

  Fursina, A ^a   Lee, S ^a   Sofin, R G S ^b   Shvets, I V ^b   Natelson, D ^a,c  

^a RICE UNIVERSITY   (United States)

^b TRINITY COLLEGE DUBLIN   (Ireland)

^c Rice University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ELECTRIC VARIABLES MEASUREMENT; ELECTRODES; THIN FILMS;

INTERELECTRODE ISOLATION; NANOSCALE ELECTRICAL CHARACTERIZATION;

NANOSTRUCTURED MATERIALS;

EID: 41049083004     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2895644     Document Type: Article

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