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Volumn 38, Issue 12, 2007, Pages 116-119
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Estimating yield of wheat spike with its texture features based on image processing technology
a
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Author keywords
Digital image processing; Estimating; Multiple linear regression; Texture feature; Wheat; Yield
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Indexed keywords
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EID: 40949142359
PISSN: 10001298
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (16)
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References (11)
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