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Volumn 91, Issue 2, 2008, Pages 319-321

Grinding free electric-field poling of Ti indiffused z-cut LiNbO 3 wafer with submicron resolution

Author keywords

[No Author keywords available]

Indexed keywords

LITHIUM COMPOUNDS; RISK ANALYSIS; ROBUST CONTROL; WAVEGUIDES;

EID: 40949140066     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-008-4405-6     Document Type: Article
Times cited : (7)

References (14)
  • 6
    • 40949112870 scopus 로고
    • US patent 5,278,924
    • J.H. Schaffner, US patent 5,278,924 (1994)
    • (1994)
    • Schaffner, J.H.1
  • 7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.