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Volumn 91, Issue 2, 2008, Pages 319-321
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Grinding free electric-field poling of Ti indiffused z-cut LiNbO 3 wafer with submicron resolution
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Author keywords
[No Author keywords available]
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Indexed keywords
LITHIUM COMPOUNDS;
RISK ANALYSIS;
ROBUST CONTROL;
WAVEGUIDES;
ELECTRIC-FIELD DOMAIN INVERSION;
LOW INDIFFUSION TEMPERATURE;
SURFACE GRINDING;
ELECTRIC FIELDS;
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EID: 40949140066
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s00339-008-4405-6 Document Type: Article |
Times cited : (7)
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References (14)
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