Feature information based quality measure for iris recognition

Conference Proceedings - IEEE International Conference on Systems, Man and Cybernetics

Volumn , Issue , 2007, Pages 3339-3345

  Belcher, Craig ^a,b   Du, Yingzi ^a,b  

^a IEEE

^b Indiana University Purdue University Indianapolis   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDPASS FILTERS; DATABASE SYSTEMS; IMAGE ANALYSIS; INFORMATION ANALYSIS;

FEATURE INFORMATION; PUPIL DILATION MEASURES;

PATTERN RECOGNITION;

EID: 40949119370     PISSN: 1062922X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSMC.2007.4413751     Document Type: Conference Paper

References (22)

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