Using simultaneous higher-level and partial lower-level data in reliability assessments

Reliability Engineering and System Safety

Volumn 93, Issue 8, 2008, Pages 1273-1279

  Graves, T L ^a   Hamada, M S ^a   Klamann, R M ^a   Koehler, A C ^a   Martz, H F ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Bayesian methods; Generalized cut sets; Markov chain Monte Carlo; Simultaneous multi level data; Success failure data

Indexed keywords

BAYESIAN NETWORKS; MARKOV PROCESSES; MONTE CARLO METHODS; RELIABILITY ANALYSIS; SYSTEMS ENGINEERING;

BAYESIAN METHODS; FAILURE DATA; SIMULTANEOUS MULTI-LEVEL DATA;

DATA PROCESSING;

EID: 40949106870     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ress.2007.07.002     Document Type: Article

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