Charge creation, trapping, and long phosphorescence in Sr2 Mg Si2 O7: Eu2+, RE3+

Journal of Applied Physics

Volumn 103, Issue 5, 2008, Pages

  Setlur, A A ^a   Srivastava, A M ^a   Pham, H L ^b   Hannah, M E ^b   Happek, U ^b  

^a GE GLOBAL RESEARCH   (United States)

^b UNIVERSITY OF GEORGIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRON TRAPS; PHOTOIONIZATION; SPECTROSCOPIC ANALYSIS;

THERMAL IONIZATION THRESHOLD; THERMAL QUENCHING;

PHOSPHORS;

EID: 40849134215     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2844473     Document Type: Article

References (27)

1. T. Matsuzawa, Y. Aoki, N. Takeuchi, and Y. Murayama, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1837067 143, 2670 (1996).
2. Y. Lin, Z. Tang, Z. Zhang, X. Wang, and J. Zhang, J. Mater. Sci. Lett. JMSLD5 0261-8028 10.1023/A:1017930630889 20, 1505 (2001).
3. P. Dorenbos, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.1926652 152, H107 (2005).
4. P. Dorenbos, Phys. Status Solidi B PSSBBD 0370-1972 10.1002/pssb. 200409080 242, R7 (2005).
5. F. Clabau, X. Rocquefelte, S. Jobic, P. Deniard, M.-H. Whangbo, A. Garcia, and T. Le Mercier, Chem. Mater. CMATEX 0897-4756 10.1021/cm050763r 17, 3904 (2005).
6. T. Aitasalo, P. Deren, J. Hölsä, H. Jungner, J.-C. Krupa, M. Lastusaari, J. Legendziewicz, J. Niittykoski, and W. Strek, J. Solid State Chem. JSSCBI 0022-4596 10.1016/S0022-4596(02)00194-9 171, 114 (2003).
7. Y. Chen, B. Liu, M. Kirm, Z. Qi, C. Shi, M. True, S. Vielhauer, and G. Zimmerer, J. Lumin. JLUMA8 0022-2313 10.1016/j.jlumin.2005.05.011 118, 70 (2006).
8. E. Nakazawa, Y. Murazaki, and S. Saito, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2397284 100, 113113 (2006).
9. H. Yamamoto and T. Matsuzawa, J. Lumin. JLUMA8 0022-2313 72-74, 287 (1997).
10. T. Aitasalo, P. Deren, J. Hölsä, H. Jungner, M. Lastusaari, J. Nittykoski, and W. Strek, Radiat. Meas. RMEAEP 1350-4487 10.1016/j.radmeas.2004. 01.009 38, 515 (2004).
11. M. Kimata, Z. Kristallogr. ZEKRDZ 0044-2968 163, 295 (1983).
12. A. R. Schulze and H. K. Mueller-Buschbaum, Z. Anorg. Allg. Chem. ZAACAB 0044-2313 10.1002/zaac.19814750423 475, 205 (1981).
13. G. Blasse, W. L. Wanmaker, J. W. ter Vrugt, and A. Bril, Philips Res. Rep. PRREA9 0031-7918 23, 189 (1968).
14. D. L. Huber, J. Lumin. JLUMA8 0022-2313 10.1016/S0022-2313(99)00607-9 86, 95 (2000).
15. L. L. Chase, S. A. Payne, and G. D. Wilke, J. Phys. C JPSOAW 0022-3719 10.1088/0022-3719/20/7/010 20, 953 (1987).
16. A. Meijerink and G. Blasse, J. Phys. D JPAPBE 0022-3727 10.1088/0022-3727/24/6/028 24, 997 (1991).
17. S. P. Keller, J. E. Mapes, and G. Cheroff, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.108.663 108, 663 (1957).
18. L. H. Robins and J. A. Tuchman, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.57.12094 57, 12094 (1998).
19. R. L. Fuller and D. S. McClure, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.43.27 43, 27 (1991).
20. W. Mou and D. S. McClure, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.47.11031 47, 11031 (1993).
21. D. Jia, W. Jia, and Y. Jia, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2409767 101, 023520 (2007).
22. P. Dorenbos, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/15/3/322 15, 575 (2003).
23. G. Blasse, Struct. Bonding (Berlin) STBGAG 0081-5993 76, 153 (1991).
24. P. Dorenbos, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/15/49/018 15, 8417 (2003).
25. C. K. Duan, A. Meijerink, R. J. Reeves, and M. F. Reid, J. Alloys Compd. JALCEU 0925-8388 408-412, 784 (2006).
26. A. A. Setlur (unpublished).
27. J. Grimm, J. F. Suyver, E. Beurer, G. Carver, and H.-U. Güdel, J. Phys. Chem. B JPCBFK 1089-5647 10.1021/jp055930p 110, 2093 (2006).