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Volumn 75, Issue 2, 2008, Pages 424-431

Quantitative determinations of SiC and SiO2 in new ceramic materials by Fourier transform infrared spectroscopy

Author keywords

Ceramic materials; Fourier transform infrared spectroscopy; Multivariate calibration; Silica; Silicon carbide

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE;

EID: 40849102610     PISSN: 00399140     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.talanta.2007.11.045     Document Type: Article
Times cited : (9)

References (27)
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    • Statgraphics Plus Versión 6.0, Referente Manual, Manugistics Rockwille, MD, 1992.
    • Statgraphics Plus Versión 6.0, Referente Manual, Manugistics Rockwille, MD, 1992.
  • 23
    • 40849107383 scopus 로고    scopus 로고
    • Physical Electronics, Multitechnique ESCA Referente manual for the PC-ACCES Software Versión 6.0, Physical Electronics, Minneapolis, USA, 1995.
    • Physical Electronics, Multitechnique ESCA Referente manual for the PC-ACCES Software Versión 6.0, Physical Electronics, Minneapolis, USA, 1995.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.