Mechanisms and models for crack detection with induction thermography

AIP Conference Proceedings

Volumn 975, Issue , 2008, Pages 475-482

  Vrana, J ^a,b   Goldammer, M ^a   Baumann, J ^a   Rothenfusser, M ^a   Arnold, W ^b  

^a SIEMENS AG   (Germany)

^b SAARLAND UNIVERSITY   (Germany)

Author keywords

Crack detection; Current density; Induction thermography

Indexed keywords

EID: 40849097860     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2902698     Document Type: Conference Paper

References (8)

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