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Volumn 387, Issue 13, 2008, Pages 3227-3238

Comparing confidence limits for short-run process incapability index Cpp

Author keywords

Bayesian bootstrap; Bootstrap pivotal; Bootstrap resampling; Coverage percentage; Process incapability index; Relative coverage; Upper confidence limit

Indexed keywords

BAYESIAN NETWORKS; COMPUTER SIMULATION; MANUFACTURE;

EID: 40849085101     PISSN: 03784371     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physa.2008.01.100     Document Type: Article
Times cited : (4)

References (18)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.