Dual-detector optical MEMS spectrum analyzer: Advances, applications, and prospects

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6887, Issue , 2008, Pages

  Otto, Thomas ^a   Saupe, Ray ^a   Weiss, Alexander ^b   Stock, Volker ^c   Wiesner, Kerstin ^d   Lampe, Uwe ^d   Fleischer, Maximilian ^d   Gessner, Thomas ^a,b  

^a FRAUNHOFER IZM   (Germany)

^b CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^c COLOUR CONTROL Farbmesstechnik GmbH ^*  (Germany)

^d SIEMENS AG   (Germany)

Author keywords

MOEMS; NIR spectroscopy; Spectrometer; Spectrum analyzer

Indexed keywords

MEMS; MIRRORS; NEAR INFRARED SPECTROSCOPY; PARAMETER ESTIMATION; REAL TIME SYSTEMS; SPECTRUM ANALYZERS;

MICRO MIRROR SPECTROMETERS; MOEMS; NIR SPECTROSCOPY; OPTICAL PARAMETERS;

OPTICAL SYSTEMS;

EID: 40749083577     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.768356     Document Type: Conference Paper

References (8)

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3. nd English Edition, Bruker Optik GmbH 2006.
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8. Otto, T.; Saupe, R.; Weiß, A.; Stock, V.; Gessner, T.: Forensische Untersuchungen mittels MEMS-Spektrometern, MikroSystemTechnik-Kongress Proceedings, ISBN 978-3-8007-3061-2, VDE VERLAG GMBH, Berlin und Offenbach, 2007.