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Volumn 39, Issue 3-4, 2008, Pages 365-368

Electron pumping through quantum dots defined in parallel etched quantum wires

Author keywords

Electrical current standard; Electron pump; Electron transport; Quantum dot; Quantum wires; Single electron transport

Indexed keywords

ELECTRON TRANSPORT PROPERTIES; SEMICONDUCTOR QUANTUM DOTS;

EID: 40649123314     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2008.01.004     Document Type: Article
Times cited : (3)

References (7)
  • 4
    • 1642321064 scopus 로고    scopus 로고
    • Current quantization due to single-electron transfer in Si-wire charge coupled devices
    • Fujiwara A., Zimmerman N.M., Ono Y., and Takahashi Y. Current quantization due to single-electron transfer in Si-wire charge coupled devices. Appl. Phys. Lett. 84 8 (2004) 1323
    • (2004) Appl. Phys. Lett. , vol.84 , Issue.8 , pp. 1323
    • Fujiwara, A.1    Zimmerman, N.M.2    Ono, Y.3    Takahashi, Y.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.