A bran-new feature extraction method and its application to surface defect recognition of hot rolled strips

Proceedings of the IEEE International Conference on Automation and Logistics, ICAL 2007

Volumn , Issue , 2007, Pages 2069-2074

  Wu, Guifang ^a   Zhang, Haichao ^a   Sun, Xiuming ^a   Xu, Jinwu ^b   Xu, Ke ^b  

^a HENAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

Feature extraction; Genetic algorithm; Hot rolled strips; Spectrum image; Surface defect recognition

Indexed keywords

GENETIC ALGORITHMS; HOT ROLLING; PIXELS; SURFACE DEFECTS;

AUTOMATIC RECOGNITION; HOT ROLLED STRIPS; SUM OF VALID PIXELS (SVP);

FEATURE EXTRACTION;

EID: 40649121333     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICAL.2007.4338916     Document Type: Conference Paper

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