Characterization of iridium thin films for TES microcalorimeters

Journal of Low Temperature Physics

Volumn 151, Issue 1-2 PART 1, 2008, Pages 167-172

  Bogorin, Daniel F ^a   Galeazzi, M ^a  

^a UNIVERSITY OF MIAMI   (United States)

Author keywords

Critical current; Iridium; Superconductor; Transition edge sensors

Indexed keywords

CHARACTERIZATION; CRITICAL CURRENTS; IRIDIUM; MAGNETRON SPUTTERING; PHOTOLITHOGRAPHY; SUPERCONDUCTING DEVICES; SUPERCONDUCTING TRANSITION TEMPERATURE; TEMPERATURE SENSORS; TIN;

MICROCALORIMETER; RADIO FREQUENCY MAGNETRON SPUTTERING; RESIDUAL RESISTIVITY RATIO; TRANSITION EDGE SENSOR;

CALORIMETERS;

EID: 40649097233     PISSN: 00222291     EISSN: 15737357     Source Type: Journal    
DOI: 10.1007/s10909-007-9622-4     Document Type: Article

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