Fast electron transport and induced heating in solid targets from rear-side interferometry imaging

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 77, Issue 2, 2008, Pages

  Malka, G ^a   Nicolai Ph ^b   Brambrink, E ^c   Santos, J J ^b   Aleonard M M ^a   Amthor, K ^d   Audebert, P ^c   Breil, J ^b   Claverie, G ^a   Gerbaux, M ^a   Gobet, F ^a   Hannachi, F ^a   Meot V ^e   Morel, P ^e   Scheurer, J N ^a   Tarisien, M ^a   Tikhonchuk, V ^b  

^a UNIVERSITÉ DE BORDEAUX   (France)

^b CENTRE LASERS INTENSES ET APPLICATIONS   (France)

^c Centre National de la Recherche Scientifique   (France)

^d FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^e Service de Physique Nucléaire ^*  (France)

Author keywords

[No Author keywords available]

Indexed keywords

HEATING; HOT ELECTRONS; IMAGE ANALYSIS; INTERFEROMETRY;

HOT ELECTRON CURRENT; OPTICAL FAST INTERFEROMETRY DIAGNOSTICS; TEMPERATURE PROFILES;

ELECTRON TRANSPORT PROPERTIES;

EID: 40549123987     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.77.026408     Document Type: Article

References (27)