Characteristics of light intensity enhancement of a silver nanoprism with rounded corners

Journal of Microscopy

Volumn 229, Issue 3, 2008, Pages 545-550

  Yamaguchi, K ^a,c   Inoue, T ^a   Fujii, M ^b   Ogawa, T ^a,d   Matsuzaki, Y ^a   Okamoto, T ^a   Haraguchi, M ^a   Fukui, M ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

^b TOBA NATIONAL COLLEGE OF MARITIME TECHNOLOGY   (Japan)

^c ANAN NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^d NICHIA CORPORATION   (Japan)

Author keywords

Curvature radius; Finite difference time domain method; Localized surface plasmon; Nanooptical switch; Scanning near field microscopy; Silver nanoprism

Indexed keywords

ION BEAM LITHOGRAPHY; ION BEAMS; NANOSTRUCTURES; PRISMS; SILVER; SURFACE PLASMONS;

CURVATURE RADIUS; FOCUSSED ION-BEAMS; LIGHT INTENSITY ENHANCEMENT; LOCALIZED SURFACE PLASMON; NANOOPTICAL SWITCH; ROUNDED CORNERS; SCANNING NEAR FIELD MICROSCOPY; SCATTERING SPECTRA; SIDE LENGTH; SILVER NANOPRISMS;

FINITE DIFFERENCE TIME DOMAIN METHOD;

SILVER;

ARTICLE; ELECTROMAGNETIC FIELD; IMAGE ANALYSIS; LIGHT INTENSITY; MICROSCOPY; NANOTECHNOLOGY; PRIORITY JOURNAL; PRISM; SURFACE PLASMON RESONANCE;

EID: 40549122645     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.01941.x     Document Type: Article

References (18)