A novel technique for measuring one-dimensional permittivity profiles using a simple non-commensurate planar structure

IEEE Microwave and Wireless Components Letters

Volumn 18, Issue 3, 2008, Pages 155-157

  Ocera, Alessandro ^b   Fratticcioli, Elisa ^b   Dionigi, Marco ^b   Sorrentino, Roberto ^a,b  

^a IEEE

^b UNIVERSITY OF PERUGIA   (Italy)

Author keywords

Material characterization; Microwave imaging; Permittivity; Profiles evaluation

Indexed keywords

ELECTRIC LOADS; ELECTRIC VARIABLES MEASUREMENT; PERMITTIVITY;

ATTENUATION POLE FREQUENCIES; MATERIAL CHARACTERIZATION; MICROWAVE IMAGING; PROFILES EVALUATION;

PLANAR WAVEGUIDES;

EID: 40549115355     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2008.916774     Document Type: Article

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