A further look at the correlation between item parameters and item fit statistics

Journal of Educational Measurement

Volumn 45, Issue 1, 2008, Pages 1-15

  Sinharay, Sandip ^a   Lu, Ying ^a  

^a EDUCATIONAL TESTING SERVICE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 40549109644     PISSN: 00220655     EISSN: 17453984     Source Type: Journal    
DOI: 10.1111/j.1745-3984.2007.00049.x     Document Type: Article

References (22)

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