|
Volumn 229, Issue 3, 2008, Pages 540-544
|
Fluorescent two-photon nanolithography
|
Author keywords
Lithography; Nanolithography; Two photon absorption
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
FLUORESCENCE;
LASER BEAMS;
NANOLITHOGRAPHY;
PHOTOPOLYMERIZATION;
TWO PHOTON PROCESSES;
EXCITATION CONDITIONS;
EXPERIMENTAL EVIDENCE;
FABRICATED STRUCTURES;
NANOMETRES;
ORDERS OF MAGNITUDE;
PHOTO POLYMERIZATION;
PRECISE CONTROL;
SCANNING SPEED;
TWO PHOTON;
TWO PHOTON ABSORPTION;
PHOTONS;
POLYMER;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
FLUORESCENCE;
IMAGE RECONSTRUCTION;
NANOTECHNOLOGY;
PHOTON;
POLYMERIZATION;
PRIORITY JOURNAL;
|
EID: 40549107096
PISSN: 00222720
EISSN: 13652818
Source Type: Journal
DOI: 10.1111/j.1365-2818.2008.01940.x Document Type: Article |
Times cited : (13)
|
References (13)
|