Proposed modelling of the X-ray intensities in high-pressure crystalline phases of methane and silane

High Pressure Research

Volumn 28, Issue 1, 2008, Pages 29-34

  Angilella, G G N ^a   March, N H ^b   Pucci, R ^a  

^a UNIVERSITY OF CATANIA   (Italy)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

CH4 (methane); SiH4 (silane); X ray scattering

Indexed keywords

METHANE; PHASE INTERFACES; PRESSURE EFFECTS; SILANES; X RAY ANALYSIS;

COMPRESSED SOLIDS; CRYSTALLINE PHASES; VAPOUR PHASES; X-RAY INTENSITIES;

CRYSTALLINE MATERIALS;

EID: 40549089893     PISSN: 08957959     EISSN: 14772299     Source Type: Journal    
DOI: 10.1080/08957950701846133     Document Type: Article

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