Visible light photolysis of hydrogen iodide using sensitized layered metal oxide semiconductors: The role of surface chemical modification in controlling back electron transfer reactions

Journal of Physical Chemistry B

Volumn 101, Issue 14, 1997, Pages 2508-2513

  Saupe, Geoffrey B ^a   Mallouk, Thomas E ^a   Kim, Won ^b   Schmehl, Russell H ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b Tulane University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4043174761     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp9625319     Document Type: Article

References (31)

1. (a) Gerischer, H. Photochem. Photobiol. 1972, 16, 243.
2. (a) Spitler, M. T.; Calvin, M. J. Chem. Phys. 1977, 66, 4294.
3. (b) Gleria, M.; Memming, R. Z. Phys. Chem., Neue Folge 1975, 98, 302.
4. (c) Clark, W. D. K. J. Am. Chem. Soc. 1977, 99, 4676.
5. (d) Memming, R.; Schröppel, F.; Bringmann, U. J. Electroanal. Chem. 1979, 100, 307.
6. (e) Hamnett, A.; Dare-Edwards, M. P.; Wright, R. D.; Seddon, K. R.; Goodenough, J. B. J. Phys. Chem. 1979, 83, 3280.
7. (f) Dare-Edwards, M. P.; Goodenough, J. B.; Hamnett, A.; Seddon, K. R.; Wright, R. D. Faraday Discuss. Chem. Soc. 1980, 70, 285.
8. (g) Frei, H.; Fitzmaurice, D. J.; Grätzel, M. Langmuir 1990, 6, 198.
9. (h) Kamat, P. V. Chem. Rev. 1993, 93, 267.
10. (a) O'Regan, B.; Grätzel, M. Nature 1991, 353, 737.
11. (b) Nazeeruddin, M. K.; Kay, A.; Rodicio, I.; Humphry-Baker, R.; Müller, E.; Liska, P.; Vlachopoulos, N.; Grätzel, M. J. Am. Chem. Soc. 1993, 115, 6382.
12. (c) Pechy, P.; Rotzinger, F. P.; Nazeeruddin, M. K.; Kohle, O.; Zakeeruddin, S. M.; Humphry-Baker, R.; Grätzel, M. J. Chem. Soc., Chem. Commun. 1995, 65.
13. (d) Hagfeldt, A.; Grätzel, M. Chem. Rev. 1995, 95, 49.
14. (a) Desilvestro, J.; Grätzel, M.; Kavan, L.; Moser, J. J. Am. Chem. Soc. 1985, 107, 2988.
15. (b) Liska, P.; Vlachopoulos, N.; Nazeeruddin, M. K.; Comte, P.; Grätzel, M. J. Am. Chem. Soc. 1988, 110, 3686.
16. (c) Amadelli, R.; Argazzi, R.; Bignozzi, C. A.; Scandola, F. J. Am. Chem. Soc. 1990, 112, 7099.
17. (d) Argazzi, R.; Bignozzi, C. A.; Heimer, T. A.; Castellano, F. N.; Meyer, G. J. Inorg. Chem. 1994, 33, 5741.
18. (e) Argazzi, R.; Bignozzi, C. A.; Heimer, T. A.; Castellano, F. N.; Meyer, G. J. J. Am. Chem. Soc. 1995, 117, 11815.
19. (a) Spitler, M. T.; Parkinson, B. A. Langmuir 1986, 2, 549.
20. (b) Chau, L.-K.; Osburn, E. J.; Armstrong, N. R.; O'Brien, D. F.; Parkinson, B. A. Langmuir 1994, 10, 351.
21. Kim, Y. I.; Salim, S.; Huq, M. J.; Mallouk, T. E. J. Am. Chem. Soc. 1991, 113, 9561.
22. Kim, Y. I.; Atherton, S. J.; Brigham, E. S.; Mallouk, T. E. J. Phys. Chem. 1993, 97, 11802.
23. Full details of the synthesis of 1 will be reported elsewhere: Kim, W. Y.; Liang, Y.; Schmehl, R. H., manuscript in preparation.
24. Marczenko, Z. Separation and Spectrophotometric Determination of Elements; Ellis Horwood: New York, 1986; p 447.
25. Awtrey, A. D.; Connick, R. E. J. Am. Chem. Soc. 1951, 73, 1842.
26. Keller, S. W.; Johnson, S.; Saupe, G. B.; Yonemoto, E. H.; Brigham, E. S.; Mallouk, T. E. ACS Symp. Ser., in press.
27. For related studies involving surface-adsorbed phosphonate monolayers and sensitizers, see ref 3c and the following. (a) Yan, S. G.; Hupp, J. T. J. Phys. Chem. 1996, 100, 6867. (b) Folkers, J. P.; Gorman, C. B.; Laibinis, P. E.; Buchholz, S.; Whitesides, G. M.; Nuzzo, R. G. Langmuir 1995, 11, 813.
28. For related studies involving surface-adsorbed phosphonate monolayers and sensitizers, see ref 3c and the following. (a) Yan, S. G.; Hupp, J. T. J. Phys. Chem. 1996, 100, 6867. (b) Folkers, J. P.; Gorman, C. B.; Laibinis, P. E.; Buchholz, S.; Whitesides, G. M.; Nuzzo, R. G. Langmuir 1995, 11, 813.
29. Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559.
30. Miller, C.; Cuendet, P.; Gratzel, M. J. Phys. Chem. 1991, 95, 877.
31. 2+ and methylviologen dichloride, for which the charge-recombination rate constant is known, in the presence of alumina (on which neither component adsorbs) as a scatterer. An effective path length of 0.11 mm was calculated for 380 nm analyzing light. Full details are given in ref 11.