AFM and ESEM characterisation of functionally nanostructured fibres

Applied Surface Science

Volumn 236, Issue 1-4, 2004, Pages 456-460

  Wei, Q F ^a   Wang, X Q ^b   Gao, W D ^a  

^a JIANGNAN UNIVERSITY   (China)

^b ANHUI POLYTECHNIC UNIVERSITY   (China)

Author keywords

AFM; ESEM; Morphology; Nanostructures; Sputtering

Indexed keywords

ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; COATING TECHNIQUES; FIBERS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SPUTTERING;

CHAMBER PRESSURE; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY (ESEM); NANOSTRUCTURES; SPUTTER COATING;

NANOSTRUCTURED MATERIALS;

EID: 4043170447     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.094     Document Type: Article

References (6)

1. Frenot A., Chronakis I.S. Curr. Opin. Colloid Interf. Sci. 8(1):2003;64-75.
2. Chen H., Cao Y.G., Xiang X.W., Li J.T., Ge C.C. J. Alloys Compd. 325(1-2):2001;L1-L3.
3. Devaux E. Industrie Textile. 1350:2003;58-60.
4. Fox G.R., Damjanovic D. Sens. Actuators A: Physical. 63(2):1997;153-160.
5. Rädlein E., Frischat G.H. J. Non-Cryst. Solids. 222(11):1997;69-82.
6. Wei Q.F., Mather R.R., Fotheringham A.F., Yang R.D. Textile Res. J. 73(6):2003;557-561.