Time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of the application of a cationic conditioner to "clean" hair

Journal of Cosmetic Science

Volumn 55, Issue 3, 2004, Pages 265-279

  Harvey, A ^a   Carr, C M ^a   Pereira, A ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b Croda Inc   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANIONIC SURFACTANT; CARBON; SILICON; CATION; COSMETIC; SURFACTANT;

ADSORPTION; ARTICLE; CHEMICAL PROCEDURES; CLEANING; HAIR; HAIR ANALYSIS; TIME OF FLIGHT MASS SPECTROMETRY; CHEMISTRY; HUMAN; MASS SPECTROMETRY; SURFACE PROPERTY;

CATIONS; HAIR; HAIR PREPARATIONS; HUMANS; SPECTROMETRY, MASS, SECONDARY ION; SURFACE PROPERTIES; SURFACE-ACTIVE AGENTS;

EID: 4043162883     PISSN: 00379832     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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