Depth capabilities of neutron and synchrotron diffraction strain measurement instruments. II. Practical implications

Journal of Applied Crystallography

Volumn 37, Issue 4, 2004, Pages 607-612

  Withers, Philip John ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CALCULATION; CALIBRATION; ENERGY; GEOMETRY; INSTRUMENT; MATERIALS; MEASUREMENT; NEUTRON DIFFRACTION; RADIATION DOSE; SAMPLE SIZE; SIGNAL NOISE RATIO; STRESS STRAIN RELATIONSHIP; SYNCHROTRON RADIATION; X RAY;

EID: 4043160904     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889804012750     Document Type: Article

References (6)

1. Bragg, W. H. & Pierce, S. E. (1914). Philos. Mag. 18, 626-630.
2. Cullity, B. D. (1978). In Elements of X-ray Diffraction. Reading, MA: Addison-Wesley.
3. Stelmukh, V., Edwards, L., Stantisteban, J. R., Ganguly, S. & Fitzpatrick, M. E. (2002). Mater. Sci. Forum, 404-407, 599-604.
4. Webster, G. A. (2000). Neutron Diffraction Measurements of Residual Stress in a Shrink-Fit Ring and Plug. Versailles Project on Advanced Materials and Standards TWA20. VAMAS Report No. 38. (ISSN 1016-2186.)
5. Webster, G. A. (2001). Editor. Poly crystalline Materials - Determinations of Residual Stresses by Neutron Diffraction. ISO/TTA3 Technology Trends Assessment. Geneva: ISO.
6. Withers, P. J. (2004). J. Appl. Cryst. 37, 596-606.