Room-temperature growth of Al films on Si(111)-7×7 surface

Chinese Physics Letters

Volumn 21, Issue 8, 2004, Pages 1608-1611

  Liu, Hong ^a   Zhang, Yan Feng ^a   Wang, De Yong ^a   Jia, Jin Feng ^a   Xue, Qi Kun ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY;

AL FILMS; ELASTIC EFFECTS; FREE SURFACE ENERGY; POLYCRYSTALLINE; REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION; ROOM TEMPERATURE GROWTH; SI(1 1 1)-7 × 7; SI(111)7×7; STRUCTURE AND MORPHOLOGY;

METALLIC FILMS;

EID: 4043160522     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/21/8/055     Document Type: Article

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