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Volumn 96, Issue 4, 2004, Pages 1091-1102

Screening yield monitor data improves grain yield maps

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ERROR ANALYSIS; GRAIN (AGRICULTURAL PRODUCT); IRRIGATION; MAPS; MOISTURE; RANDOM PROCESSES;

EID: 4043147054     PISSN: 00021962     EISSN: None     Source Type: Journal    
DOI: 10.2134/agronj2004.1091     Document Type: Article
Times cited : (69)

References (26)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.