Quantitative determination of the magnetization of proton irradiated spots in graphite with magnetic force microscopy

Journal of Applied Physics

Volumn 96, Issue 3, 2004, Pages 1581-1584

  Han, K H ^a   Esquinazi, P ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; COMPUTATIONAL METHODS; ETCHING; FERROMAGNETISM; GRAPHITE; MAGNETIC FIELDS; PHASE SHIFT; PROTON IRRADIATION; SEMICONDUCTING SILICON; SQUIDS; VACUUM;

HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG); MAGNETIC ETCH SILICON PROBE (MESP); MAGNETIC FORCE MICROSCOPY (MFM); ROOM TEMPERATURE;

MAGNETIZATION;

EID: 4043140180     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1759396     Document Type: Article

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