Electrical and optical properties of sol-gel derived la modified PbTiO 3 thin films

Applied Surface Science

Volumn 236, Issue 1-4, 2004, Pages 321-327

  Chopra, Sonalee ^a   Sharma, Seema ^a   Goel, T C ^b   Mendiratta, R G ^c  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b BIRLA INSTITUTE OF TECHNOLOGY AND SCIENCE   (India)

^c NETAJI SUBHAS INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Electrical properties; PLT; Sol gel coatings; Thin films

Indexed keywords

ACETIC ACID; ATOMIC FORCE MICROSCOPY; CAPACITORS; CRYSTALLIZATION; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; REFRACTIVE INDEX; SOL-GELS; SPECTROPHOTOMETERS; STOICHIOMETRY; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC CAPACITORS; PYROELECTRIC DEVICES; QUARTZ SUBSTRATES; SOL-GEL COATINGS;

THIN FILMS;

EID: 4043116867     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.004     Document Type: Article

References (27)

1. Krupanidhi S.B. J. Vac. Sci. Technol. A. 10:1992;1569.
2. Lakeman C.D.E., Payne D.A. J. Am. Ceram. Soc. 75:1992;3091.
3. Lu C.J., Ren S.B., Shen H.M., Liu J.S., Wang Y.N. J. Vac. Sci. Technol. A. 14:1997;2167.
4. Vijayaraghavan C., Goel T.C., Mendiaratta R.G. IEEE Trans. Diel. Electr. Insul. 6:1999;69.
5. Maeda M., Ishida H., Soe K.K.K., Suzuki I. Jpn. J. Appl. Phys. 32:1993;4136.
6. J.B. Jaffe, W.R. Cook, H. Jaffe, Piezoelectric Ceramics, Academic Press, New York, 1971.
7. Takahashi T. Ceram. Bull. 69:1990;691.
8. Takeuchi H., Jyomura S., Yamamoto E., Ito Y. J. Acoust. Soc. Am. 72:1982;1114.
9. Yamashita Y., Yokoyama K., Honda H., Takahashi T. Jpn. J. Appl. Phys. 20:1981;183.
10. Chopra S., Tripathi A.K., Goel T.C., Mendiratta R.G. J. Mater. Sci. Eng. B. 100:2003;180.
11. Chopra S., Sharma S., Goel T.C., Mendiratta R.G. Solid State Commun. 127:2003;299.
12. Kang Y.M., Baik S. J. Mater. Res. 13:1998;995.
13. Ren W., Liu Y., Wu X., Zhang L., Yao X. Integ. Ferroelectr. 15:1997;271.
14. Neumayer D.A., Purtell R.J., Kane W.F., Grill A. Integ. Ferroelectr. 14:1997;85.
15. Manifacier J.C., Gasiot J., Fillard J.P. J. Phys. E: Sci. Instrum. 9:1976;1002.
16. F. Jona, G. Shirane, Ferroelectric Crystals, Pergamon Press, Oxford, UK, 1962.
17. Iijima K., Takayama R., Tomita Y., Ueda I. J. Appl. Phys. 60:1986;2914.
18. Wu D., Li A.D., Ge C.Z., Lu P., Xu C.Y., Xu J., Ming N.B. Thin Solid Films. 322:1998;323.
19. Koo J., No K., Bae B.S. J. Sol-Gel Sci. Technol. 13:1998;869.
20. Damjanovic D. Rep. Prog. Phys. 61:1998;1267.
21. Tsuzuki A., Murakami H., Kani K., Watari K., Torri Y. J. Mater. Sci. Lett. 10:1991;125.
22. F. Xu, R.A. Wolf, T. Yoshimura, S.T. McKinstry, in: Proceedings of the 11th International Symposium on Electrets, Melbourne, Australia, 2002, p. 386.
23. Cho S.M., Jeon D.Y. Thin Solid Films. 338:1999;149.
24. Scott J.F., Araujo C.A., Melnick B.M., Millan L.D., Zuleeg R. J. Appl. Phys. 70:1991;382.
25. G. Barbottin, A. Vapaille, Instabilities in Silicon Devices: Silicon Passivation and Related Instabilitie, North-Holland, Amsterdam, 1986.
26. Sudhama C., Campbell A.C., Maniar P.D., Jones R.E., Moazzami R., Mogabb C.J. J. Appl. Phys. 75:1994;1014.
27. Wang F., Leppavuon S. J. Appl. Phys. 82:1997;1293.