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Volumn 64, Issue 16, 2001, Pages

Light scattering from disordered overlayers of metallic nanoparticles

Author keywords

[No Author keywords available]

Indexed keywords

METAL; SILICON; SILICON DIOXIDE;

EID: 4043087707     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.165405     Document Type: Article
Times cited : (12)

References (44)
  • 39
    • 85038940652 scopus 로고    scopus 로고
    • In the numerical calculations we used (formula presented). This is sufficient to obtain convergence for the scattered intensity. However, the results for the fields near a particle presented in Fig. 77 would change to a certain extent if more multipoles were included
    • In the numerical calculations we used (formula presented). This is sufficient to obtain convergence for the scattered intensity. However, the results for the fields near a particle presented in Fig. 77 would change to a certain extent if more multipoles were included.
  • 42
    • 85038934055 scopus 로고    scopus 로고
    • In the experiment the peaks occur at about 780 and 1250 nm. The sample used there had also a 30 nm thick LiF top layer
    • In the experiment the peaks occur at about 780 and 1250 nm. The sample used there had also a 30 nm thick LiF top layer.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.