Sequential Bayesian bit error rate measurement

IEEE Transactions on Instrumentation and Measurement

Volumn 53, Issue 4, 2004, Pages 947-954

  Barford, Lee ^a  

^a IEEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BIT ERROR RATE; ERROR ANALYSIS; EXTRAPOLATION; MATHEMATICAL MODELS; MEASUREMENT THEORY; PROBABILITY DISTRIBUTIONS;

BAYES PROCEDURE; BIT ERROR RATE MEASUREMENT; COMMUNICATION EQUIPMENT TESTING; DIGITAL MEASUREMENT;

DIGITAL COMMUNICATION SYSTEMS;

EID: 4043078401     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.831129     Document Type: Article

References (10)

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