Cognitive deficits in schizophrenia: Short-term and long-term

World Psychiatry

Volumn 7, Issue 1, 2008, Pages 29-30

  Kane, John M ^a,b,c   Lencz, Todd ^a,b,c  

^a ZUCKER HILLSIDE HOSPITAL   (United States)

^b FEINSTEIN INSTITUTE FOR MEDICAL RESEARCH   (United States)

^c ALBERT EINSTEIN COLLEGE OF MEDICINE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLINICAL COMPETENCE; CLINICAL PRACTICE; COGNITIVE DEFECT; CONSTRUCT VALIDITY; CORRELATION ANALYSIS; CRITERION VARIABLE; DIAGNOSTIC AND STATISTICAL MANUAL OF MENTAL DISORDERS; DIAGNOSTIC VALUE; GENETIC ANALYSIS; GENETIC RISK; GENETIC SUSCEPTIBILITY; GENETIC VARIABILITY; HUMAN; MEDICAL ETHICS; MEDICOLEGAL ASPECT; MEMORY DISORDER; NOTE; ONSET AGE; PRIORITY JOURNAL; PROGNOSIS; PSYCHOSIS; SCHIZOPHRENIA; SYMPTOMATOLOGY;

EID: 40349087559     PISSN: 17238617     EISSN: None     Source Type: Journal    
DOI: 10.1002/j.2051-5545.2008.tb00143.x     Document Type: Note

References (20)