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Volumn 37, Issue 3, 2008, Pages 748-762

Nonlinear dynamic analysis of atomic force microscopy under deterministic and random excitation

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; APPROXIMATION THEORY; DYNAMIC ANALYSIS; FREQUENCY MODULATION; NONLINEAR EQUATIONS; PERTURBATION TECHNIQUES;

EID: 40249113112     PISSN: 09600779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chaos.2006.09.079     Document Type: Article
Times cited : (45)

References (19)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.