|
Volumn 37, Issue 3, 2008, Pages 748-762
|
Nonlinear dynamic analysis of atomic force microscopy under deterministic and random excitation
|
Author keywords
[No Author keywords available]
|
Indexed keywords
AMPLITUDE MODULATION;
APPROXIMATION THEORY;
DYNAMIC ANALYSIS;
FREQUENCY MODULATION;
NONLINEAR EQUATIONS;
PERTURBATION TECHNIQUES;
INTERMOLECULAR FORCES;
MICROCANTILEVER;
RANDOM EXCITATION;
ATOMIC FORCE MICROSCOPY;
|
EID: 40249113112
PISSN: 09600779
EISSN: None
Source Type: Journal
DOI: 10.1016/j.chaos.2006.09.079 Document Type: Article |
Times cited : (45)
|
References (19)
|