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Volumn 35, Issue 10, 2008, Pages 3107-3124

GA-based multiple paths test data generator

Author keywords

Genetic algorithms; Path testing; Software testing; Test data generator

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION; COST REDUCTION; GENETIC ALGORITHMS; PROBLEM SOLVING; PROCESS PLANNING;

EID: 40249100301     PISSN: 03050548     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cor.2007.01.012     Document Type: Article
Times cited : (130)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.