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Volumn 2, Issue 23, 2006, Pages 63-74
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STM imaging of proteins on semiconducting substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
DEFECT STRUCTURES;
NEUTRON SCATTERING;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTOR MATERIALS;
VIRUSES;
X RAY DIFFRACTION ANALYSIS;
HUMAN IMMUNODEFICIENCY VIRUS (HIV);
RESONANT ELECTRON TUNNELLING;
PROTEINS;
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EID: 40249094896
PISSN: 19385862
EISSN: 19386737
Source Type: Conference Proceeding
DOI: 10.1149/1.2409009 Document Type: Conference Paper |
Times cited : (3)
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References (36)
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