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Volumn 2, Issue 23, 2006, Pages 63-74

STM imaging of proteins on semiconducting substrates

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT STRUCTURES; NEUTRON SCATTERING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; VIRUSES; X RAY DIFFRACTION ANALYSIS;

EID: 40249094896     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2409009     Document Type: Conference Paper
Times cited : (3)

References (36)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.