Effect of excess Bi2O3 on the ferroelectric and dielectric properties of Bi3.25La0.75Ti3O12 thin films by RF sputtering method

Materials Science and Engineering: B

Volumn 149, Issue 1, 2008, Pages 34-40

  Wu, Yunyi ^a   Zhang, Duanming ^a   Yu, Jun ^a   Wang, Yunbo ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Bi2O3 excess; BLT; RF magnetron sputtering; Thin film

Indexed keywords

BISMUTH COMPOUNDS; COERCIVE FORCE; FERROELECTRICITY; MAGNETRON SPUTTERING; X RAY DIFFRACTION;

BLT FILMS; COERCIVE VOLTAGE; FATIGUE RESISTANCE CHARACTERISTICS; PEROVSKITE STRUCTURE;

THIN FILMS;

EID: 40149101117     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.12.002     Document Type: Article

References (23)