Rietveld refinement of the ranciéite structure using synchrotron powder diffraction data

Powder Diffraction

Volumn 23, Issue 1, 2008, Pages 10-14

  Post, Jeffrey E ^a   Heaney, Peter J ^b   Ertl, Andreas ^c  

^a SMITHSONIAN INSTITUTION   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF VIENNA   (Austria)

Author keywords

Ranc ite; Rietveld refinement; Synchrotron

Indexed keywords

MN-VACANCIES; OCTAHEDRAL SHEETS; OCTAHEDRALLY COORDINATED; SYNCHROTRON POWDER DIFFRACTION; SYNCHROTRON POWDER X-RAY DIFFRACTIONS;

MANGANESE; MOLECULES; SYNCHROTRONS; X RAY DIFFRACTION;

RIETVELD REFINEMENT;

EID: 40149099470     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.2836477     Document Type: Article

References (25)