Femtosecond laser damage threshold and nonlinear characterization in bulk transparent SiC materials

Journal of the Optical Society of America B: Optical Physics

Volumn 25, Issue 1, 2008, Pages 60-66

  DesAutels, G Logan ^a   Brewer, Chris ^b   Walker, Mark ^d   Juhl, Shane ^b   Finet, Marc ^a   Ristich, Scott ^a   Whitaker, Matt ^a   Powers, Peter ^c  

^a AT and T Government Solutions   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c UNIVERSITY OF DAYTON   (United States)

^d GENERAL DYNAMICS INFORMATION TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; LASER DAMAGE; LASER RADIATION; REFRACTIVE INDEX; SILICON CARBIDE;

BULK TRANSPARENT MATERIALS; CRYSTALLINE TRANSPARENT SUBSTRATES; DAMAGE THRESHOLD; NONLINEAR CHARACTERIZATION;

ULTRASHORT PULSES;

EID: 40149094035     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.25.000060     Document Type: Article

References (16)